MATHEMATICAL MODEL OF POINT EVENTS IN CCD IMAGES

被引：0
|
作者：
Moroni, Guillermo Fernandez [1 ,2 ]
Haro, Miguel Sofo [3 ]
Tiffenberg, Javier [2 ]
Cancelo, Gustavo [2 ]
Paolini, Eduardo E. [1 ,4 ]
Estrada, Juan [2 ]
Bertou, Xavier [3 ]
机构：
[1] Univ Sur, CONICET, IIIE, Bahia Blanca, Buenos Aires, Argentina
[2] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA
[3] Univ Nacl Cuyo, Inst Balseiro, CONICET, Ctr Atom Bariloche,Lab Detecc Particulas & Radiac, San Carlos De Bariloche, Rio Negro, Argentina
[4] Comis Inv Cient Prov Buenos Aires CIC, Buenos Aires, DF, Argentina
来源：
2015 XVI WORKSHOP ON INFORMATION PROCESSING AND CONTROL (RPIC) | 2015年
关键词：
HIGH-RESISTIVITY SILICON; NOBEL LECTURE; NOISE;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this article a stochastic model for point events expected in the output image of scientific CCDs is derived. This kind of events are typical in CCD systems dedicated to particle detection, such as DAMIC and CONNIE. The model includes the randomness of the charge movement in the silicon and the noise at the readout stage providing the base for an optimal detection technique.
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页数：6
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