Electro-optical measurements of ultrashort 45 MeV electron beam bunch

被引：0
|
作者：
Nikas, D [1 ]
Castillo, V
Kowalski, L
Larsen, R
Lazarus, DM
Ozben, C
Semertzidis, YK
Tsang, T
Srinivasan-Rao, T
机构：
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
[2] Montclair State Univ, Montclair, NJ 07043 USA
来源：
INTERNATIONAL JOURNAL OF MODERN PHYSICS A | 2001年 / 16卷
关键词：
D O I：
10.1142/S0217751X01009168
中图分类号：
O57 [原子核物理学、高能物理学];
学科分类号：
070202 ;
摘要：
We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the optical beam path distance from the electron beam. The risetime of the signal was bandwidth limited by our detection system to similar to 70 ps. An EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. The EO technique may be ideal for the measurement of bunch structure with femtosecond resolution of relativistic charged particle beam bunches.
引用
收藏
页码：1150 / 1152
页数：3
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