Effects of Amplitude Variations on Deformation and Damage Evolution in SnAgCu Solder in Isothermal Cycling

被引:16
|
作者
Wentlent, Luke [1 ]
Alghoul, Thaer M. [2 ]
Greene, Christopher M. [2 ]
Borgesen, Peter [2 ]
机构
[1] Univ Instruments Corp, Binghamton, NY 13904 USA
[2] SUNY Binghamton, Dept Syst Sci & Ind Engn, POB 6000, Binghamton, NY 13902 USA
基金
美国国家科学基金会;
关键词
Lead-free; microstructure; recrystallization; fatigue cycling; creep; JOINT FATIGUE LIFE; THERMOMECHANICAL RESPONSE; CREEP-BEHAVIOR; SN; AG; RECRYSTALLIZATION; RELIABILITY; ORIENTATION; ANISOTROPY; FAILURE;
D O I
10.1007/s11664-018-6129-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Although apparently simpler than in thermal cycling, the behavior of SnAgCu (SAC) solder joints in cyclic bending or vibration is not currently well understood. The rate of damage has been shown to scale with the inelastic work per cycle, and excursions to higher amplitudes lead to an apparent softening, some of which remains so that damage accumulation is faster in subsequent cycling at lower amplitudes. This frequently leads to a dramatic breakdown of current damage accumulation rules. An empirical damage accumulation rule has been proposed to account for this, but any applicability to the extrapolation of accelerated test results to life under realistic long-term service conditions remains to be validated. This will require a better understanding of the underlying mechanisms. The present work provides experimental evidence to support recent suggestions that the observed behavior is a result of cycling-induced dislocation structures providing for increased diffusion creep. It is argued that this means that the measured work is an indicator of the instantaneous dislocation density, rather than necessarily reflecting the actual work involved in the creation of the damage.
引用
收藏
页码:2752 / 2760
页数:9
相关论文
共 50 条
  • [1] Effects of Amplitude Variations on Deformation and Damage Evolution in SnAgCu Solder in Isothermal Cycling
    Luke Wentlent
    Thaer M. Alghoul
    Christopher M. Greene
    Peter Borgesen
    Journal of Electronic Materials, 2018, 47 : 2752 - 2760
  • [2] Effect of Cycling Amplitude Variations on SnAgCu Solder Joint Fatigue Life
    Hamasha, Sa'd
    Akkara, Francy
    Su, Sinan
    Ali, Haneen
    Borgesen, Peter
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 8 (11): : 1896 - 1904
  • [3] Effects of Strain Rate and Amplitude Variations on Solder Joint Fatigue Life in Isothermal Cycling
    Hamasha, Sa'd
    Borgesen, Peter
    JOURNAL OF ELECTRONIC PACKAGING, 2016, 138 (02)
  • [4] A Damage Model for SnAgCu Solder under Thermal Cycling
    Xiao, Hui
    Li, Xiaoyan
    Liu, Na
    Yan, Yongchang
    2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP), 2011, : 772 - 776
  • [5] Damage behavior of SnAgCu solder under thermal cycling
    Xiao, H. (huixiao@emails.bjut.edu.cn), 1600, Science Press (42):
  • [6] Damage Behavior of SnAgCu Solder under Thermal Cycling
    Xiao Hui
    Li Xiaoyan
    Yan Yongchang
    Liu Na
    Shi Yaowu
    RARE METAL MATERIALS AND ENGINEERING, 2013, 42 (02) : 221 - 226
  • [7] Deformation characteristics and microstructural evolution of SnAgCu solder joints
    Reinikainen, TO
    Marjamäki, P
    Kivilahti, JK
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005, : 91 - 98
  • [8] Effects of Thermal Cycling on Creep of SnAgCu Solder Joints
    Alghoul, T.
    Wentlent, L.
    Sivasubramony, R.
    Greene, C.
    Thompson, P.
    Borgesen, P.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2019, 9 (05): : 888 - 894
  • [9] Damage behavior of SnAgCu/Cu solder joints subjected to thermomechanical cycling
    Xiao, H.
    Li, X. Y.
    Hu, Y.
    Guo, F.
    Shi, Y. W.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2013, 578 : 110 - 117
  • [10] Damage behavior of SnAgCu/Cu solder joints subjected to thermomechanical cycling
    Xiao, H. (xiaohui2013@yahoo.com.cn), 1600, Elsevier Ltd (578):