Temperature dependence of current-voltage (I-V) characteristics of Pt/Au Schottky contacts on n-type GaN

被引:0
|
作者
Ravinandan, M. [1 ]
Rao, P. Koteswara [1 ]
Reddy, V. Rajagopal [1 ]
机构
[1] Sri Venkateswara Univ, Dept Phys, Tirupati 517502, Andhra Pradesh, India
来源
关键词
Temperature-dependent I-V characteristics; Pt/Au Schottky Contacts; n-type GaN; I-V technique;
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The current-voltage (I-V) characteristics of Pt/Au Schottky contact on n-type GaN were measured in wide temperature range 85-405 K. The IN curves is fitted by the equation based on thermionic emission theory, but the zero-bias barrier height (phi(BO)) decreases and the ideality factor (n) increases with decreasing temperature. The zero-bias barrier height (phi(BO)), ideality factor (n) and series resistance (R-s) values are seen to be strongly temperature dependent. It is shown that the values of series resistances (R-s) were strongly temperature dependent and decreased with increasing temperature, and values were found in the range 1493 Omega at 85 K- 94 Omega at 405 K. The flat-band barrier height phi(BF)(T=0 K) and temperature coefficient (alpha) are evaluated to be 0.71 eV and 1.91 x 10(-3) eV/K by the current-voltage method. The calculated value of Richardson constant is 14.6 Acm(-2)K(-2) from temperature dependent I-V studies, which is lower than the known value. It can be concluded that the temperature dependence of I-V characteristics of the Pt/Au/n-GaN Schottky diode can be successfully explained on the basis of thermionic emission (TE) mechanism.
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页码:2787 / 2792
页数:6
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