Structural and ferroelectric properties of textured KNN thick films prepared by sol-gel methods

被引：9

作者：

Yang, Xiuying ^{[1
]}

Cheng, Zhangjie ^{[1
]}

Cheng, Junye ^{[3
]}

Wang, Dawei ^{[4
]}

Shi, Feng ^{[1
]}

Zheng, Guangping ^{[5
]}

Liu, Hongmei ^{[1
]}

Zhang, Deqing ^{[1
]}

Cao, Maosheng ^{[2
]}

机构：

[1] Qiqihar Univ, Sch Mat Sci & Engn, Qiqihar, Peoples R China

[2] Beijing Inst Technol, Sch Mat Sci & Engn, Beijing, Peoples R China

[3] City Univ Hong Kong, Dept Phys & Mat Sci, Ctr Super Diamond & Adv Films, Hong Kong, Hong Kong, Peoples R China

[4] North China Univ Technol, Dept Mat Sci & Engn, Beijing, Peoples R China

[5] Hong Kong Polytech Univ, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China

来源：

INTEGRATED FERROELECTRICS | 2016年 / 176卷 / 01期

基金：

中国国家自然科学基金;

关键词：

Sol-gel methods; textured KNN thick film; sheet-like microstructure; LEAD-FREE PIEZOCERAMICS; PIEZOELECTRIC PROPERTIES;

D O I：

10.1080/10584587.2016.1252242

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Based on the templates of sheet-like KNN powders synthesized by a hydrothermal method, lead-free textured KNN films with a thickness of 5m were prepared by sol-gel methods. The composition, microstructure, crystal structure, ferroelectric properties and grain growth mechanisms of the textured KNN thick films were studied. It was found that the KNN thick films possessed large grain sizes, dense morphology and increased ratio of Na+. After annealed at 650 degrees C, the perovskite structure was observed in the KNN thick films textured along the < 001 > crystallography direction with an orientation factor of 0.393, reflecting a preferential growth characteristics. Furthermore, the residual polarization value of 12.3 mu c/cm(2) was achieved under the same condition.

引用

页码：171 / 178

页数：8

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