Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry

被引：0
|
作者：
Sáinz, C [1 ]
Calatroni, J [1 ]
Escalona, R [1 ]
机构：
[1] Univ Metropolitana, Dept Fis, Caracas 1070A, Venezuela
来源：
OPTICAL DIAGNOSTICS FOR FLUIDS SOLIDS AND COMBUSTION | 2001年 / 4448卷
关键词：
refractometry; interferometry; chanelled spectra;
D O I：
10.1117/12.449374
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Spectrally Resolved White Light Interferometry (SRWLI) is used for precise measurements of both the sample width and the differential refractive index, attaining precision of about 10(-6) in the refractive index. This is achieved through the experimental simulation of a thin virtual cell about 40mum wide.
引用
收藏
页码：169 / 178
页数：10
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