High-rate deposition of nanostructured SiC films by thermal plasma PVD

被引:16
|
作者
Wang, X. H. [1 ]
Eguchi, K. [1 ]
Iwamoto, C. [2 ]
Yoshida, T. [1 ]
机构
[1] Univ Tokyo, Grad Sch Engn, Dept Mat Engn, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1138656, Japan
[2] Univ Tokyo, Grad Sch Engn, Engn Res Inst, Bunkyo Ku, Tokyo 1138656, Japan
关键词
Thermal plasma; PVD; nanostructured films; Silicon carbide films;
D O I
10.1016/S1468-6996(02)00041-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
With ultrafine SiC powder as starting material, thermal plasma physical vapor deposition has been applied successfully to the deposition of SiC films on Si substrates. The control of processing parameters such as substrate temperature, powder feeding rate and composition of plasma gases, permits the deposition of SiCfilms on a wide area of around 400 cm(2) with a variety of microstructures from amorphous to nanostructured and with various morphologies from dense to columnar. For the nanostructured case, the crystallite size was between 3 and 15 nm and the maximum deposition rate calculated based on the actual deposition duty time reached 200 nm/s. The deposition mechanism is discussed briefly. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:313 / 317
页数:5
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