X-ray diffraction investigation on Cu2ZnSiSe4 single and polycrystalline crystals

被引:12
|
作者
Gurieva, Galina [1 ]
Levcenko, Sergiu [1 ]
Kravtsov, Victor Ch. [2 ]
Nateprov, Alexander [2 ]
Irran, Elisabeth [3 ]
Huang, Ying-Sheng [4 ]
Arushanov, Ernest [2 ]
Schorr, Susan [1 ,5 ]
机构
[1] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany
[2] Moldavian Acad Sci, Inst Appl Phys, Kishinev 2028, MD, Moldova
[3] Tech Univ Berlin, Inst Chem, D-10623 Berlin, Germany
[4] Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei 106, Taiwan
[5] Free Univ Berlin, Inst Geowissensch, D-12249 Berlin, Germany
关键词
Cu2ZnSiSe4; single crystal; X-ray diffraction;
D O I
10.1515/zkri-2014-1825
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Cu2ZnSiSe4 belong to the adamantine family of quaternary chalcogenides crystallizing in the wurtzstannite structure. Recent ab-initio calculations show, that the lowest energy structure of Cu2ZnSiSe4 is the wurtzkesterite type structure in contrast to wurtzstannite type, usually obtained in experiments. To clarify this issue a structural study on single crystals of Cu2ZnSiSe4 was performed for the first time. The structural characterization of the single crystals was carried out by X-ray diffraction at two different temperatures - room temperature and 150 K. The XRD data analysis shows, that Cu2ZnSiSe4 single crystals adopt the orthorhombic wurtzstannite type structure (space group Pmn2(1)) and lattice parameters a = 7.809 angstrom, b = 6.778 angstrom, c = 6.447 angstrom at 150 K, and lattice parameters a = 7.821 angstrom, b = 6.734 angstrom, c = 6.453 angstrom at room temperature were derived. The structural parameters were confirmed for the polycrystalline Cu2ZnSiSe4 bulk sample.
引用
收藏
页码:507 / 511
页数:5
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