Frequency- and intensity-noise measurements of a widely tunable 2-μm Tm-Ho:KYF laser

被引：5
|
作者：
Galzerano, G [1 ]
Sani, E
Toncelli, A
Tonelli, M
Svelto, C
Laporta, P
机构：
[1] Politecn Milan, Ist Foton & Nanotecnol, IFN, CNR,Dipartimento Fis, I-20133 Milan, Italy
[2] Univ Pisa, Natl Enterprise Nanosci & Nanotechnol, NEST INFM, Dipartimento Fis, I-56100 Pisa, Italy
[3] Politecn Milan, Dipartimento Elettr & Informaz, IEITT CNR, I-20133 Milan, Italy
[4] INFM, I-20133 Milan, Italy
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2006年 / 55卷 / 01期
关键词：
diode-pumped laser; frequency-noise measurement; intensity-noise measurement; solid-state laser; tunable laser;
D O I：
10.1109/TIM.2005.861261
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The measurement of the frequency and intensity noise in a novel single-mode 2-mu m Tm-Ho:KYF laser is presented. The laser frequency noise is measured by exploiting the fringe side of the transmission of a Fabry-Perot interferometer. The measured power spectral density of the frequency noise is principally characterized by a random-walk noise contribution, which sets an emission linewidth of similar to 600 kHz for the 2-mu m radiation. The relative intensity noise (RIN) reaches the quantum limit of -155 dB/Hz for Fourier frequencies above 1 MHz and shows a maximum level of -90 dB/Hz at the relaxation-oscillation frequency of 20 kHz.
引用
收藏
页码：128 / 131
页数：4
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