Spot Mura Quantification Analysis for LED Edge-Lit Display

被引：0

作者：

Ruan, Hung-Shiang ^{[1
]}

Pan, Shiang-Yuan ^{[1
]}

Chen, Chien-Wen ^{[1
]}

Wang, Ko-Shun ^{[1
]}

机构：

[1] AU Optron Corp, Measurement Technol Dept, Hsinchu, Taiwan

来源：

IDW'10: PROCEEDINGS OF THE 17TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3 | 2010年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Spot Mura is one of the major defects for Edge-lit LED Backlight. We use CCD camera system instead of human inspectors' eyes to judge the Mura level and furthermore more objectively obtain an appreciate value. Therefore we develop a suitable analysis algorithm to quantify it by connecting CCD camera system measurement values with human inspectors' experience.

引用

页码：1409 / 1411

页数：3

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