A method for phase unwrapping based on digital spackle correlation

被引：1
|
作者：
He, Dong [1 ]
Li, Ameng [1 ]
Liu, Xiaoli [1 ]
Peng, Xiang [1 ]
机构：
[1] Shenzhen Univ, Coll Optoelect Engn, Key Lab Optoelect Devices & Syst, Minist Educ & Guangdong Prov, Shenzhen 518060, Peoples R China
来源：
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II | 2012年 / 8563卷
关键词：
fringe projection; phase unwrapping; optical measurement systems; computer vision; ALGORITHM;
D O I：
10.1117/12.999965
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new method for phase unwrapping is proposed, which makes the unwrapping of phase images realistic without binary codes or more frequency fringe images produced by projection systems, uses only one additional digital speckle pattern projected to help finding correspondence points. It means that the novel method is by the use of the additional speckle pattern to achieve a unique point correspondence. The proposed method to get unwrapped phase will save images recorded time. Experiment results demonstrated the proposed method is effective and robust.
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页数：6
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