Influence of the substrate on the growth of α,ω-dihexyl-quaterthiophene thin films by organic molecular beam deposition

被引：8
|
作者：
Besana, D
Borghesi, A
Campione, M
Sassella, A
Tubino, R
Moret, M
Rinaldi, R
Garnier, F
机构：
[1] Univ Milan, Ist Nazl Fis Mat, I-20125 Milan, Italy
[2] Univ Milan, Dipartimento Sci Mat, I-20125 Milan, Italy
[3] Univ Milan, Dipartimento Sci Mat, I-20125 Milan, Italy
[4] Univ Lecce, Ist Nazl Fis Mat, I-73100 Lecce, Italy
[5] Univ Lecce, Dipartimento Ingn Innovazione, I-73100 Lecce, Italy
[6] CNRS, Mat Mol Lab, F-94320 Thiais, France
来源：
JOURNAL OF CRYSTAL GROWTH | 2002年 / 235卷 / 1-4期
关键词：
atomic force microscopy; crystal morphology; organic molecular beam deposition; organic compounds;
D O I：
10.1016/S0022-0248(01)01783-3
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The role of the substrate in influencing the structure and morphology of alpha,omega-dihexyl-quaterthiophene (DH4T) thin films grown by organic molecular beam deposition was investigated by means of atomic force microscopy (AFM) imaging and optical absorption measurements. Silica and potassium acid phthalate (KAP) substrates were selected as representative of inorganic amorphous and organic crystalline substrates, respectively. The film growth mechanism was found to depend on the flatness, cleanliness, and structure of the substrate, which influence the overgrown film. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：241 / 247
页数：7
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