Vertical Transport in GaN/AlGaN Resonant Tunneling Diodes and Superlattices

Using the transfer matrix formalism, we have theoretically studied the vertical ballistic transport in GaN/AlGaN resonant tunneling diodes (RTDs) and superlattices with a small number of periods. We have calculated the transmission probability versus the longitudinal electron energy (T-E) and the current density-voltage (J-V) characteristics. Calculations of both T-E and J-V characteristics have been performed for different Al contents in the barriers. The asymmetry effects due to the internal electric field in the barriers are discussed. Applied to the RTD structure, our calculations demonstrate: (i) the increase of the peak-to-valley ratio of the negative differential resistance (NDR) with increasing Al content in the barriers, (ii) the dependence of the J-V resonance values on the current direction, and (iii) the asymmetry of the NDR with respect to the current direction due to the huge internal electric field in the structure. In the case of multiple quantum well structure (MQWS), the calculation results confirm the same trends as in the RTD case when the Al content is varied. In spite of the fact that it is more difficult to analyze the results in the case of MQWS, the obtained calculations demonstrate the applicability of the used model and of the numerical method to study GaN/AlGaN devices based on quantum well (QW) heterostructures. Furthermore, a design of an optimized 7QW structure operating symmetrically whatever the direction of the applied voltage is presented.