Electron Probe Micro-Analysis for Platinum Particle Inclusions in Nd: Glass Before and After Intense Laser Irradiation

被引：0
|
作者：
Cheng Jimeng [1 ,2 ]
Wen Lei [1 ]
Zhou Qinling [1 ]
Ni Jiachuan [1 ]
Chen Wei [1 ]
Hu Lili [1 ]
机构：
[1] Chineses Acad Sci, Shanghai Inst Opt & Fine Mech, R&D Ctr High Power Laser Components, Shanghai 201800, Peoples R China
[2] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
来源：
CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG | 2019年 / 46卷 / 03期
关键词：
materials; Nd : glass; platinum particle inclusion; electron probe micro-analyzer; detection by high power laser irradiation; DAMAGE;
D O I：
10.3788/CJL201916.0303001
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The electron probe micro-analyzer (EPMA) technology is used to analyze and study various forms of platinum (Pt) particle inclusions in continuous-smelted Nd : glass before and after intense laser irradiation. After intense laser irradiation, platinum particle inclusions exhibit three typical EPMA morphology. Their forms come from the joint result of the thermal stress and vapor pressure caused by platinum particles absorbing laser energy. The thermodynamic properties of Nd: glass also have an effect on the morphology. The phenomenon of Pt-Zr-Sn being co-wrapped is found by comparing the EPMA distribution characteristics of zirconium and stannum impurity inclusions.
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页数：8
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