Polarized neutron reflectometry on metal evaporated videotapes

被引:1
|
作者
vanderGraaf, A
Fredrikze, H
Rekveldt, MT
机构
[1] Interfacultair Reactor Instituut, TU Delft
来源
PHYSICA B | 1996年 / 221卷 / 1-4期
关键词
D O I
10.1016/0921-4526(95)00955-8
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
An 11 mm wide recorder head was used to simulate the writing process on one- and two-layer Hi8 metal evaporated videotapes. Polarized neutron reflectometry was used to study the in-plane magnetization as a function of depth after the writing process. Data for different magnetic states were fitted simultaneously, with the same nuclear structure. Total in-plane magnetization from the fits agrees with VSM-results. The fitted models show that the recorder head writes throughout the whole depth in both tapes. The in-plane magnetization in the two-layer tape exhibits two maxima; it is oppositely directed in the two layers in remanence after perpendicular magnetization. These results show that polarized neutron reflectometry is a suitable technique to study the writing-mechanism on metal evaporated videotapes.
引用
收藏
页码:393 / 397
页数:5
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