A dynamic stochastic model for automatic grammar-based test generation

被引:5
|
作者
Guo, Hai-Feng [1 ]
Qiu, Zongyan [2 ]
机构
[1] Univ Nebraska, Dept Comp Sci, Omaha, NE 68182 USA
[2] Peking Univ, Dept Informat, Beijing 100871, Peoples R China
来源
SOFTWARE-PRACTICE & EXPERIENCE | 2015年 / 45卷 / 11期
关键词
grammar-based test generation; software testing; fault localization; STRATEGY;
D O I
10.1002/spe.2278
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Grammar-based test generation provides a systematic approach to producing test cases from a given context-free grammar. Unfortunately, naive grammar-based test generation is problematic because of the fact that exhaustive random test case production is often explosive, and grammar-based test generation with explicit annotation controls often causes unbalanced testing coverage. In this paper, we present an automatic grammar-based test generation approach, which takes a symbolic grammar as input, requires zero control input from users, and produces well-distributed test cases. Our approach utilizes a novel dynamic stochastic model where each variable is associated with a tuple of probability distributions, which are dynamically adjusted along the derivation. We further present a coverage tree illustrating the distribution of generated test cases and their detailed derivations. More importantly, the coverage tree supports various implicit derivation control mechanisms. We implemented this approach in a Java-based system, named Gena. Each test case generated by Gena automatically comes with a set of structural features, which can play an important and effective role on automated failure causes localization. Experimental results demonstrate the effectiveness of our approach, the well-balanced distribution of generated test cases over grammatical structures, and a case study on grammar-based failure causes localization. Copyright (C) 2014 John Wiley & Sons, Ltd.
引用
收藏
页码:1519 / 1547
页数:29
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