Security Threats and Countermeasures in Three-Dimensional Integrated Circuits

被引:12
|
作者
Dofe, Jaya [1 ]
Gu, Peng [2 ]
Stow, Dylan [2 ]
Yu, Qiaoyan [1 ]
Kursun, Eren [3 ]
Xie, Yuan [2 ]
机构
[1] Univ New Hampshire, Dept Elect & Comp Engn, Durham, NH 03824 USA
[2] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
[3] Columbia Univ, Dept Comp Sci, New York, NY 10027 USA
关键词
D O I
10.1145/3060403.3060500
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Existing works on Three-dimensional (3D) hardware security focus on leveraging the unique 3D characteristics to address the supply chain attacks that exist in 2D design. However, 3D ICs introduce specific and unexplored challenges as well as new opportunities for managing hardware security. In this paper, we analyze new security threats unique to 3D ICs. The corresponding attack models are summarized for future research. Furthermore, existing representative countermeasures, including split manufacturing, camouflaging, transistor locking, techniques against thermal signal based side-channel attacks, and network-on-chip based shielding plane (NoCSIP) for different hardware threats are reviewed and categorized. Moreover, preliminary countermeasures are proposed to thwart TSV-based hardware Trojan insertion attacks.
引用
收藏
页码:321 / 326
页数:6
相关论文
共 50 条
  • [1] Analyzing Security Vulnerabilities of Three-Dimensional Integrated Circuits
    Dofe, Jaya
    Yu, Qiaoyan
    [J]. 2017 IEEE INTERNATIONAL SYMPOSIUM ON HARDWARE ORIENTED SECURITY AND TRUST (HOST), 2017, : 156 - 156
  • [2] Three-dimensional integrated circuits
    Topol, A. W.
    La Tulipe, D. C., Jr.
    Shi, L.
    Frank, D. J.
    Bernstein, K.
    Steen, S. E.
    Kumar, A.
    Singco, G. U.
    Young, A. M.
    Guarini, K. W.
    Ieong, M.
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2006, 50 (4-5) : 491 - 506
  • [3] Three-Dimensional Integrated Circuits
    Henkel, Joerg
    [J]. IEEE DESIGN & TEST, 2016, 33 (02) : 4 - 6
  • [4] Three-dimensional integrated circuits
    Topol, Anna W.
    La Tulipe Jr., Douglas C.
    Shi, Leathen
    Frank, David J.
    Bernstein, Kerry
    Steen, Steven E.
    Kumar, Arvind
    Singco, Gilbert U.
    Young, Albert M.
    Guarini, Kathryn W.
    Ieong, Meikei
    [J]. IBM Journal of Research and Development, 2006, 50 (4-5): : 491 - 506
  • [5] Isolation in three-dimensional integrated circuits
    Margomenos, A
    Valas, S
    Herman, MI
    Katehi, LPB
    [J]. 2000 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2000, : 1875 - 1878
  • [6] Three-dimensional Integrated Circuits Design
    Xie, Yuan
    Marchal, Pol
    [J]. IET COMPUTERS AND DIGITAL TECHNIQUES, 2011, 5 (03): : 159 - 159
  • [7] Isolation in three-dimensional integrated circuits
    Margomenos, A
    Herrick, KJ
    Herman, MI
    Valas, S
    Katehi, LPB
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (01) : 25 - 32
  • [8] Electromigration in three-dimensional integrated circuits
    Shen, Zesheng
    Jing, Siyi
    Heng, Yiyuan
    Yao, Yifan
    Tu, K. N.
    Liu, Yingxia
    [J]. APPLIED PHYSICS REVIEWS, 2023, 10 (02)
  • [9] Three-dimensional integrated circuits with optical interconnections
    Kostsov, EG
    Piskunov, SV
    [J]. SECOND INTERNATIONAL CONFERENCE ON OPTICAL INFORMATION PROCESSING, 1996, 2969 : 100 - 103
  • [10] Performance trend in three-dimensional integrated circuits
    Hua, Hao
    Mineo, Chris
    Schoenfliess, Kory
    Sule, Ambarish
    Melamed, Samson
    Davis, W. Rhett
    [J]. PROCEEDINGS OF THE IEEE 2006 INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE, 2006, : 45 - +