A simple method for estimating the quality factor of cylindrical re-entrant cavity of Klystrons

被引:6
|
作者
Bansiwal, Ashok [1 ]
Raina, Sushil [1 ]
Vinoy, K. J. [2 ]
Datta, Subrata Kumar [1 ]
机构
[1] Minist Def, DRDO, MTRDC, Bangalore, Karnataka, India
[2] Indian Inst Sci IISc, Dept Elect Commun Engn, Bangalore, Karnataka, India
关键词
Conductive loss; cylindrical re-entrant cavity; Klystron; quality factor; surface finish; Wheeler's incremental inductance rule;
D O I
10.1080/09205071.2019.1592710
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A simple method for estimation of the unloaded quality factor of single and double re-entrant cylindrical cavities was developed based on Wheeler's incremental inductance rule. The proposed approach was benchmarked for a Ka-band re-entrant cavity against 3D electromagnetic simulation using CST Studio and also with measurements. The analysis is general and unlike the approach of Fujisawa, it could be extended to analyze the re-entrant cavity comprising dissimilar materials. The effect of surface roughness on the quality factor of the cavity also could be estimated using the present analysis.
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页码:1082 / 1091
页数:10
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