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- [2] DIRECT OBSERVATION OF INSULATORS IN SCANNING ELECTRON-MICROSCOPY JOURNAL DE MICROSCOPIE, 1975, 23 (01): : A7 - A8
- [5] DIRECT OBSERVATION OF VOIDS IN DOPED TUNGSTEN BY SCANNING ELECTRON MICROSCOPY METALLURGICAL TRANSACTIONS, 1971, 2 (11): : 3239 - &