Characterization of Sticking Residue on Tablet Punch Faces by Scanning Electron Microscopy and X-Ray Mapping

被引：6
|
作者：
Neilly, J. P. [1 ]
Vogt, A. D. [1 ]
Dziki, W. [1 ]
机构：
[1] Abbott Labs Global Pharmaceut Res & Dev, Dept R4R9, Abbott Pk, IL 60064 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609097165
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：18 / 19
页数：2
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