Characteristics of a thin-film sensor for a scanning SQUID microscope

被引：1
|
作者：
Kirichenko, DE [1 ]
Pavolotskii, AB [1 ]
Prokhorova, IG [1 ]
Snigirev, OV [1 ]
机构：
[1] Moscow MV Lomonosov State Univ, Moscow 119899, Russia
来源：
TECHNICAL PHYSICS | 1999年 / 44卷 / 07期
关键词：
D O I：
10.1134/1.1259360
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A description is given of the design, fabrication technology, and characteristics of a sensor for a scanning magnetic microscope using a thin-film dc SQUID with Nb/Al2O3/Nb shunted Josephson tunnel junctions. It is shown that at a sample temperature of 4.2 K the spatial resolution of this detector is 10 mu m with a field resolution of 70 pT/Hz(1/2).(C) 1999 American Institute of Physics. [S1063-7842(99)02307-7].
引用
收藏
页码：839 / 843
页数：5
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