Atomic-Resolution Aberration-Corrected Transmission Electron Microscopy

被引：2
|
作者：
Urban, Knut [1 ]
Houben, Lothar
Jia, Chun-Lin
Lentzen, Markus
Mi, Shao-Bo
Thust, Andreas
Tillmann, Karsten
机构：
[1] Helmholtz Res Ctr, Inst Solid State Res, D-52425 Julich, Germany
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 153 | 2008年 / 153卷
关键词：
D O I：
10.1016/S1076-5670(08)01011-2
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：439 / 480
页数：42
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