A Complete Sensor Model for Miniscopic Electrical Impedance Tomography

被引:0
|
作者
Wang, Yu [1 ]
Wang, Qingsong [1 ]
Ren, Shangjie [1 ]
Dong, Feng [1 ]
机构
[1] Tianjin Univ Tianjin, Sch Elect & Informat Engn, Tianjin Key Lab Proc Measurement & Control, Tianjin, Peoples R China
基金
中国国家自然科学基金;
关键词
miniscopic electrical impedance tomography; sensor design; complete sensor model; sensitivity analysis; REGULARIZATION;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electrical impedance tomography (EIT) is a promising non-destructive testing technique to image the conductivity distribution within a closed domain. Due to its advantages of non-radiation, low-cost and high temporal resolution, EIT owns many potential industrial and biological applications. To improve the application of EIT on observing mini-scale objects, a miniature EIT sensor is developed, as well as a Complete Sensor Model (CSM). The CSM has a good similarity with the actual sensor structure. As a result, the model errors are reduced. According to the numerical and experimental results, the CSM is helpful for enhancing the homogeneity of EIT sensitivity field, and thus improve the image reconstruction accuracy.
引用
收藏
页码:535 / 540
页数:6
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