Image reconstruction enables high resolution imaging at large penetration depths in fluorescence microscopy

被引:1
|
作者
Dilipkumar, Shilpa [1 ]
Montalescot, Sandra [2 ]
Mondal, Partha Pratim [1 ]
机构
[1] Indian Inst Sci, Nanobioimaging Lab, Bangalore 560012, Karnataka, India
[2] Ecole Normale Super, Dept Phys, F-94235 Cachan, France
关键词
ELECTROMAGNETIC DIFFRACTION; FIELD; ILLUMINATION; MEDIA; LIMIT; BEAM;
D O I
10.1063/1.4827191
中图分类号
O59 [应用物理学];
学科分类号
摘要
Imaging thick specimen at a large penetration depth is a challenge in biophysics and material science. Refractive index mismatch results in spherical aberration that is responsible for streaking artifacts, while Poissonian nature of photon emission and scattering introduces noise in the acquired three-dimensional image. To overcome these unwanted artifacts, we introduced a two-fold approach: first, point-spread function modeling with correction for spherical aberration and second, employing maximum-likelihood reconstruction technique to eliminate noise. Experimental results on fluorescent nano-beads and fluorescently coated yeast cells (encaged in Agarose gel) shows substantial minimization of artifacts. The noise is substantially suppressed, whereas the side-lobes (generated by streaking effect) drops by 48.6% as compared to raw data at a depth of 150 mu m. Proposed imaging technique can be integrated to sophisticated fluorescence imaging techniques for rendering high resolution beyond 150 mu m mark. (C) 2013 AIP Publishing LLC.
引用
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页数:5
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