An approach to testing commercial embedded systems

被引:6
|
作者
Yu, Tingting [1 ]
Sung, Ahyoung [2 ]
Srisa-an, Witawas [1 ]
Rothermel, Gregg [1 ]
机构
[1] Univ Nebraska, Dept Comp Sci & Engn, Lincoln, NE 68583 USA
[2] Samsung Elect Co Ltd, Div Visual Display, Suwon, Gyounggi, South Korea
关键词
Embedded systems; Software test adequacy criteria; Test oracles; ATOMICITY; SOFTWARE; VERIFICATION; GENERATION; CHECKING; MODEL; TIME;
D O I
10.1016/j.jss.2013.10.041
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
A wide range of commercial consumer devices such as mobile phones and smart televisions rely on embedded systems software to provide their functionality. Testing is one of the most commonly used methods for validating this software, and improved testing approaches could increase these devices' dependability. In this article we present an approach for performing such testing. Our approach is composed of two techniques. The first technique involves the selection of test data; it utilizes test adequacy criteria that rely on dataflow analysis to distinguish points of interaction between specific layers in embedded systems and between individual software components within those layers, while also tracking interactions between tasks. The second technique involves the observation of failures: it utilizes a family of test oracles that rely on instrumentation to record various aspects of a system's execution behavior, and compare observed behavior to certain intended system properties that can be derived through program analysis. Empirical studies of our approach show that our adequacy criteria can be effective at guiding the creation of test cases that detect faults, and our oracles can help expose faults that cannot easily be found using typical output-based oracles. Moreover, the use of our criteria accentuates the fault-detection effectiveness of our oracles. (C) 2013 Elsevier Inc. All rights reserved.
引用
收藏
页码:207 / 230
页数:24
相关论文
共 50 条
  • [1] Development of Novel Approach for Testing of Differential Embedded Systems
    Karmore, Swapnili P.
    Mahajan, Anjali R.
    [J]. 2013 SIXTH INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN ENGINEERING AND TECHNOLOGY (ICETET 2013), 2013, : 46 - 47
  • [2] A Formal Approach for Analysis and Testing of Reliable Embedded Systems
    Guerrouat, Abdelaziz
    Richter, Harald
    [J]. ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE, 2005, 141 (03) : 91 - 106
  • [3] A Methodical Approach to Functional Exploratory Testing for Embedded Systems
    Kimla, Rafal
    Czerwinski, Robert
    [J]. APPLIED SCIENCES-BASEL, 2022, 12 (19):
  • [4] A DFT approach for testing embedded systems using DC sensors
    Bhattacharya, Soumendu
    Chatterjee, Abhijit
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 2006, 23 (06): : 464 - 475
  • [5] Online Robustness Testing of Distributed Embedded Systems: an Industrial Approach
    Alnawasreh, Khaled
    Pelliccione, Patrizio
    Hao, Zhenxiao
    Range, Marten
    Bertolino, Antonia
    [J]. 2017 IEEE/ACM 39TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING: SOFTWARE ENGINEERING IN PRACTICE TRACK (ICSE-SEIP 2017), 2017, : 133 - 142
  • [6] MotoCAP STA Framework: New approach to testing of embedded systems
    Bulenkov, Konstantin P.
    [J]. 2007 IEEE INTERNATIONAL SYMPOSIUM ON CONSUMER ELECTRONICS, VOLS 1 AND 2, 2007, : 640 - 641
  • [7] New Approach for Testing and providing Security Mechanism for Embedded Systems
    Karmore, Swapnili P.
    Mahajan, Anjali R.
    [J]. 1ST INTERNATIONAL CONFERENCE ON INFORMATION SECURITY & PRIVACY 2015, 2016, 78 : 851 - 858
  • [8] Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry
    Schulz, Peter
    Wolff, Carsten
    [J]. 2019 IEEE AUTOTESTCON, 2019,
  • [9] Testing approach for online hardware self tests in embedded safety related systems
    Tamandl, Thomas
    Preininger, Peter
    Novak, Thomas
    Palensky, Peter
    [J]. ETFA 2007: 12TH IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOLS 1-3, 2007, : 1270 - 1277
  • [10] A hybrid approach to testing for nonfunctional faults in embedded systems using genetic algorithms
    Yu, Tingting
    Srisa-an, Witawas
    Cohen, Myra B.
    Rothermel, Gregg
    [J]. SOFTWARE TESTING VERIFICATION & RELIABILITY, 2018, 28 (07):