International on-wafer millimeter-wave measurement comparison transfers NIST methodology to help industry make better measurements

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JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | 1997年 / 102卷 / 05期
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TH7 [仪器、仪表];
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0804 ; 080401 ; 081102 ;
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页码：609 / 609
页数：1
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