Dopant-Free Hydrogenated Amorphous Silicon Thin-Film Solar Cells Using Molybdenum Oxide and Lithium Fluoride

被引:17
|
作者
Yang, Ji-Hwan [2 ]
Jung, Hyung-Hwan [1 ,7 ]
Seo, Jihoon [1 ]
Kim, Kwang-Dae [1 ]
Kim, Dong-Ho [1 ]
Lim, Dong-Chan [1 ]
Park, Sung-Gyu [1 ]
Kang, Jae-Wook [3 ]
Song, Myungkwan [1 ]
Choi, Min-Seung [1 ]
Kwon, Jung-Dae [1 ]
Nam, Kee-Seok [1 ]
Jeong, Yongsoo [1 ]
Kwon, Se-Hun [4 ]
Park, Yun Chang [5 ]
Kang, Yong-Cheol [6 ]
Chung, Kwun Bum [7 ]
Kim, Chang Su [1 ]
Lim, Koeng Su [2 ]
Ryu, Seung Yoon [1 ]
机构
[1] KIMS, Adv Funct Thin Films Dept, Chang Won 641831, South Korea
[2] Korea Adv Inst Sci & Technol, Dept Elect Engn, Taejon 305701, South Korea
[3] Chonbuk Natl Univ, Dept Flexible & Printable Elect, Jeonju 561756, South Korea
[4] Pusan Natl Univ, Sch Mat Sci & Engn, Pusan 609735, South Korea
[5] Natl Nanofab Ctr, Measurement & Anal Team, Taejon 305701, South Korea
[6] Pukyong Natl Univ, Dept Chem, Pusan 609735, South Korea
[7] Dankook Univ, Dept Phys, Cheonan 330714, South Korea
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2013年 / 117卷 / 45期
关键词
BUFFER LAYER; LOW-TEMPERATURE; INTERFACES; MOO3; EFFICIENT;
D O I
10.1021/jp4031656
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Toxic doping gases are usually used to produce hydrogenated amorphous silicon (a-Si:H) layers in thin-film solar cells (TFSCs). Hence, an alternative structure that avoids the use of toxic gases is desirable. In this work, we replaced both the p-type-a-Si:H and n-type-a-Si:H layers simultaneously in a normal TFSC to form a structure that is dopant-free. Molybdenum oxide (MoO3) and lithium fluoride were used as the p-type and n-type layers, respectively. The effects of the deposition method and the thickness of the MoO3 layer on the device performance were investigated. The power-conversion efficiency of the optimized hybrid solar cell reached a maximum of 7.08%, which is remarkable considering the novel structure of the dopant-free devices. The light stability of the devices with and without MoO3 was also compared: the light stability of the device with MoO3 was found to be much better than that of the device without MoO3 and with p-i-n Si layers. This was ascribed to the insignificant number of defect sites generated by the nondoping elements, which led to a less contaminated, more compact, and smoother oxide surface, resulting in an increase in the electron lifetime and improved light stability. This work opens up a new direction toward the development of a truly dopant-free device that does not involve the use of toxic gases during fabrication and provides the potential for further enhancement of the efficiency of future dopant-free solar cells.
引用
收藏
页码:23459 / 23468
页数:10
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