Tip-sample interaction in a "shear-force" near-field scanning optical microscope

被引：22
|
作者：
Hsu, K [1 ]
Gheber, LA [1 ]
机构：
[1] Johns Hopkins Univ, Dept Biol, Baltimore, MD 21218 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 09期
关键词：
D O I：
10.1063/1.1149967
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The interaction between the tip of a near-field scanning optical microscope (NSOM) and the sample it scans is analyzed and compared to a simple tapping model. The approach curves acquired with the NSOM are in excellent agreement with the model, and additional experiments strongly point against a noncontact interaction (such as shear force). Based on this model we are also able to explain the oscillations pattern of the feedback loop. We conclude that our straight-fiber tip, operating under "shear-force" control, intermittently contacts the surface it is scanning, in a way similar to the tapping mode in atomic force microscope. (C) 1999 American Institute of Physics. [S0034-6748(99)04509-8].
引用
收藏
页码：3609 / 3613
页数：5
相关论文
共 50 条
  • [1] Tip-sample interaction in a shear-force near-field scanning optical microscope
    Hsu, Kate
    Gheber, Levi A.
    Review of Scientific Instruments, 70 (09): : 3609 - 3613
  • [2] An optical tip-sample distance control for a scanning near-field optical microscope
    Kramer, A
    Hartmann, T
    Stadler, SM
    Guckenberger, R
    ULTRAMICROSCOPY, 1995, 61 (1-4) : 191 - 195
  • [3] A cryogenic scanning near-field optical microscope with shear-force gapwidth control
    Kramer, A
    Segura, JM
    Hunkeler, A
    Renn, A
    Hecht, B
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (08): : 2937 - 2941
  • [4] Dynamics of the tip-sample interaction in near-field scanning optical microscopy and the implications for shear force as an accurate distance measure
    Jahncke, CL
    Huerth, SH
    Clark, B
    Hallen, HD
    APPLIED PHYSICS LETTERS, 2002, 81 (21) : 4055 - 4057
  • [5] Non-optical shear-force detection for scanning near-field optical microscope
    Tamaru, H
    Miyano, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1997, 36 (6B): : L821 - L823
  • [6] Non-optical shear-force detection for scanning near-field optical microscope
    Univ of Tokyo, Tokyo, Japan
    Japanese Journal of Applied Physics, Part 2: Letters, 1997, 36 (06):
  • [7] The ultrasonic/shear-force microscope: Integrating ultrasonic sensing into a near-field scanning optical microscope
    La Rosa, A
    Cui, X
    McCollum, J
    Li, N
    Nordstrom, R
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (09):
  • [8] Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures' optical properties
    Bercu, N. B.
    Troyon, M.
    Molinari, M.
    JOURNAL OF MICROSCOPY, 2016, 263 (03) : 357 - 364
  • [9] BIOLOGICAL NEAR-FIELD SCANNING OPTICAL MICROSCOPY - INSTRUMENTATION AND SAMPLE ISSUES FOR SHEAR-FORCE FEEDBACK
    VALASKOVIC, GA
    HOLTON, M
    MORRISON, GH
    ULTRAMICROSCOPY, 1995, 57 (2-3) : 212 - 218
  • [10] Reduction of tip-sample interaction forces for scanning near-field optical microscopy in a liquid environment
    Lambelet, P
    Pfeffer, M
    Sayah, A
    Marquis-Weible, F
    ULTRAMICROSCOPY, 1998, 71 (1-4) : 117 - 121
12345