Drift velocity measurements in CuInS2 thin films

被引：0
|
作者：
Reddy, KV [1 ]
Kumar, AP [1 ]
机构：
[1] INDIAN INST TECHNOL,DEPT PHYS,MADRAS 600036,TAMIL NADU,INDIA
来源：
SEMICONDUCTOR DEVICES | 1996年 / 2733卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：403 / 405
页数：3
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