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- [2] Lateral and vertical quantification of spin-coated polymer films on silicon by TOF-SIMS, XPS, and AFM JOURNAL OF PHYSICAL CHEMISTRY B, 2002, 106 (51): : 13114 - 13121
- [5] C60 molecular depth profiling of bilayered polymer films using ToF-SIMS Surf Interface Anal, 1-2 (175-178):
- [7] Accurate depth profiling of oxidized SiGe (intrinsic or doped) thin films by extended Full Spectrum ToF-SIMS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 273 : 131 - 134
- [9] ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (12): : 5565 - 5573