Frequency normalised wavelet transform for surface roughness analysis and characterisation

被引：78
|
作者：
Josso, B [1 ]
Burton, DR [1 ]
Lalor, MJ [1 ]
机构：
[1] Liverpool John Moores Univ, Sch Engn, Coherent & Electroopt Res Grp, GEORG, Liverpool L3 5UX, Merseyside, England
来源：
WEAR | 2002年 / 252卷 / 5-6期
关键词：
roughness analysis; roughness characterisation; wavelet;
D O I：
10.1016/S0043-1648(02)00006-6
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
This paper proposes a new strategy for surface roughness analysis and characterisation based on the wavelet transform. After a short review of wavelet-based methods used in the field of surface roughness analysis, results obtained using a new tool of analysis called the frequency normalised wavelet transform (FNWT) are presented. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：491 / 500
页数：10
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