Simple method of surface characterization by X-ray scattering at small glancing angle of incidence using a compact UHV X-ray diffractometer

For the surface X-ray scattering experiments to be performed in a small laboratory room, we constructed a compact ultra high vacuum (UHV) X-ray diffractometer. Using this equipment, we investigated the surface roughness of iron polycrystalline surfaces. The peak profiles of the specularly reflected X-ray intensity were measured at several glancing angles of incidence. From the comparison with a simple surface structure model, it is found that the surface roughness can be immediately derived by measurements of the peak width of specularly reflected X-ray. Copyright (C) 2008 John Wiley & Sons, Ltd.