Physics-Based Analytical Model for High-Voltage Bidirectional GaN Transistors Using Lateral GaN Power HEMT

被引:0
|
作者
Waldron, J. [1 ]
Chow, T. P. [1 ]
机构
[1] Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
关键词
Wide bandgap semiconductors; GaN; Bidirectional switch; HEMT;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A bidirectional switching GaN transistor, PCB-packaged using commercially available high voltage power GaN HEMTs (200V, 3A) from EPC, has been modeled and characterized. A physics-based FET model, originally developed by Statz for short-channel GaAs MESFET, has been adapted to model both static and switching characteristics of both the constituent HEMT and the bidirectional switch up to 125 degrees C. We have found that the Statz model is superior to conventional short-channel MOSFET models due to the mixed pentode-triode on-state I-V characteristics of the EPC GaN HEMT. The bidirectional GaN transistor exhibits linear operation as well as bidirectional current saturation, offering low on-state resistance along with current limiting capabilities.
引用
收藏
页码:213 / 216
页数:4
相关论文
共 50 条
  • [1] A Physics-Based Compact Device Model for GaN HEMT Power Devices
    Kotecha, Ramchandra M.
    Zhang, Yuzhi
    Rashid, Arman
    Vrotsos, Tom
    Mantooth, H. Alan
    2016 IEEE 4TH WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS (WIPDA), 2016, : 108 - 113
  • [2] Two-Step GaN Layer Growth for High-Voltage Lateral AlGaN/GaN HEMT
    Yusuf, Yusnizam
    Samsudin, Muhammad Esmed Alif
    Taib, Muhamad Ikram Md
    Ahmad, Mohd Anas
    Mohamed, Mohamed Fauzi Packeer
    Kawarada, Hiroshi
    Falina, Shaili
    Zainal, Norzaini
    Syamsul, Mohd
    CRYSTALS, 2023, 13 (01)
  • [3] An Accurate Compact Model for GaN Power Switches with the Physics-based ASM-HEMT Model
    Khandelwal, Sourabh
    Labrecque, M.
    Huang, Y.
    Qi, F.
    Wang, Z.
    Smith, P.
    Wu, Y.
    Lal, R.
    2021 THIRTY-SIXTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2021), 2021, : 2389 - 2392
  • [4] Breakdown Voltage Assessment of GaN HEMT Devices through Physics-Based Modeling
    Lashway, Christopher R.
    Berzoy, Alberto
    Elsayad, Nour
    Mohammed, Osama
    2017 INTERNATIONAL APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY SYMPOSIUM - ITALY (ACES), 2017,
  • [5] A physics-based electrical model of a magnetically sensitive AlGaN/GaN HEMT
    Nebojsa Jankovic
    Soroush Faramehr
    Petar Igic
    Journal of Computational Electronics, 2022, 21 : 191 - 196
  • [6] A physics-based electrical model of a magnetically sensitive AlGaN/GaN HEMT
    Jankovic, Nebojsa
    Faramehr, Soroush
    Igic, Petar
    JOURNAL OF COMPUTATIONAL ELECTRONICS, 2022, 21 (01) : 191 - 196
  • [7] A Physics-Based Analytical Model for 2DEG Charge Density in AlGaN/GaN HEMT Devices
    Khandelwal, Sourabh
    Goyal, Nitin
    Fjeldly, Tor A.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (10) : 3622 - 3625
  • [8] A Physics Based Analytical Model and Numerical Simulation for Current-Voltage Characteristics of Microwave Power AlGaN/GaN HEMT
    Subramani, N. K.
    Nallatamby, J-C.
    Sahoo, A. K.
    Sommet, R.
    Quere, R.
    Bindu, B.
    2016 IEEE MTT-S INTERNATIONAL MICROWAVE AND RF CONFERENCE (IMARC), 2016,
  • [9] Analytical Loss Model of High Voltage GaN HEMT in Cascode Configuration
    Huang, Xiucheng
    Li, Qiang
    Liu, Zhengyang
    Lee, Fred C.
    2013 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2013, : 3587 - 3594
  • [10] Analytical Loss Model of High Voltage GaN HEMT in Cascode Configuration
    Huang, Xiucheng
    Li, Qiang
    Liu, Zhengyang
    Lee, Fred C.
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2014, 29 (05) : 2208 - 2219