Identification of the weak features in N 1s near-edge X-ray absorption fine structure of N2O multilayer

被引：4
|
作者：
Wu, Tai-Quan [1 ]
Zhu, Ping [2 ]
Tang, Jing-Chang [2 ]
Jiang, Zhou-Ting [1 ]
机构：
[1] China Jiliang Univ, Dept Phys, Hangzhou 310018, Zhejiang, Peoples R China
[2] Zhejiang Univ, Dept Phys, Hangzhou 310027, Zhejiang, Peoples R China
来源：
PHYSICA B-CONDENSED MATTER | 2008年 / 403卷 / 23-24期
关键词：
Multiple-scattering cluster; Near-edge X-ray absorption fine structure; Self-consistent field DV-X alpha method; N2O multilayer;
D O I：
10.1016/j.physb.2008.08.023
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The multi pie-scattering cluster method has been employed to calculate N 1s near-edge X-ray absorption fine structure (NEXAFS) of N2O single molecule and N2O multilayer. It has been shown that the complicated weak features in the NEWS of N2O Multilayer are attributed to four sigma resonances and two weak features. Two weak features are attributed to the interaction between N2O molecular layers. The result of the self-consistent field (SCF) DV-X alpha calculation of N2O multilayer has confirmed above conclusion. The analysis of N2O numbers in molecular chain shows the feature sigma(1) is weakened due to the interaction between the intermediate photoelectron and the potential of the ionic molecules. (C) 2008 Elsevier B.V. Ail rights reserved.
引用
收藏
页码：4151 / 4155
页数：5
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