A scheme for lensless X-ray microscopy combining coherent diffraction imaging and differential corner holography

被引：11

作者：

Capotondi, F. ^{[1
]}

Pedersoli, E. ^{[1
]}

Kiskinova, M. ^{[1
]}

Martin, A. V. ^{[2
]}

Barthelmess, M. ^{[3
]}

Chapman, H. N. ^{[2
,4
]}

机构：

[1] Elettra Sincrotrone Trieste, Fermi, I-34149 Trieste, Italy

[2] Ctr Free Electron Laser Sci, D-22607 Hamburg, Germany

[3] DESY, D-22607 Hamburg, Germany

[4] Univ Hamburg, D-22761 Hamburg, Germany

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 22期

关键词：

FREE-ELECTRON LASER; RECONSTRUCTION; ALGORITHMS; RESOLUTION; PHASE;

D O I：

10.1364/OE.20.025152

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We successfully use the corners of a common silicon nitride supporting window in lensless X-ray microscopy as extended references in differential holography to obtain a real space hologram of the illuminated object. Moreover, we combine this method with the iterative phasing techniques of coherent diffraction imaging to enhance the spatial resolution on the reconstructed object, and overcome the problem of missing areas in the collected data due to the presence of a beam stop, achieving a resolution close to 85 nm. (C) 2012 Optical Society of America

引用

下载

页码：25152 / 25160

页数：9

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