Polycrystalline Sm(Co,Cu)5 films with perpendicular anisotropy grown on (0002) Ru(Cr)

被引：13
|
作者：
Liu, Xiaoqi [1 ,2 ]
Zhao, Haibao [1 ,2 ]
Kubota, Yukiko [3 ]
Wang, Jian-Ping [1 ,2 ]
机构：
[1] Univ Minnesota, Ctr Micromagnet & Informat Technol MINT, Minneapolis, MN 55455 USA
[2] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
[3] Seagate Res, Pittsburgh, PA 15222 USA
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2008年 / 41卷 / 23期
关键词：
D O I：
10.1088/0022-3727/41/23/232002
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Polycrystalline Sm-Co-Cu films with SmCo(5) phase and (0 0 0 1) texture using a dc magnetron sputtering process were successfully fabricated directly on an (0 0 0 2) Ru(Cr) underlayer on heated glass substrates at 350 degrees C. The mean grain size of the Sm(CoCu)(5) layer is 17 nm, the smallest ever reported on SmCo(5) film with perpendicular anisotropy. Strong exchange coupling between grains, as indicated by the coercivity squareness, was found in the obtained Sm(Co,Cu)(5) films. An estimated perpendicular magnetic anisotropy constant, as high as 1.4 x 10(8) erg cm(-3), was achieved on these films. An 'unusually' high perpendicular coercivity (11 kOe) was found on these exchange-coupled polycrystalline Sm(Co, Cu)(5) films. This was explained by a pinning-site model which was supported by the measurement of the coercivity angular dependence.
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页数：5
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