Fast projection based depth for focused plenoptic camera

被引：0
|
作者：
Hu, Guangchao [1 ]
Zhang, Yong [1 ]
Wang, Zhenjie [1 ]
机构：
[1] Beihang Univ, Sch Instrumentat Sci & Optoelect Engn, Beijing, Peoples R China
来源：
PROCEEDINGS FIRST INTERNATIONAL CONFERENCE ON ELECTRONICS INSTRUMENTATION & INFORMATION SYSTEMS (EIIS 2017) | 2017年
关键词：
depth measurement; light field; projection feature;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The focused plenoptic cameras capture the scenes by one snap, which means calibration is not required. Therefore it is a great advantage to obtain the depth information. However, the existing algorithms to obtain the depth information are complicated and time consuming. In this paper, we put forward a depth measurement method based on the data obtained by focused plenoptic camera. The simulation experiment proved that this method is time-saving and has a good performance compared with the classical method.
引用
收藏
页码：759 / 762
页数：4
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