Stochastic Characterization of Voltage Sag Occurrence Based on Field Data

被引:22
|
作者
dos Santos, Andre [1 ]
Rosa, Tiago [2 ]
Correia de Barros, Maria Teresa [3 ]
机构
[1] Rede Elect Nacl SA, P-1700177 Lisbon, Portugal
[2] CERN, Machine Protect & Elect Integr Grp, P-1500529 Lisbon, Portugal
[3] Univ Lisbon, Inst Super Tecn, P-1649004 Lisbon, Portugal
关键词
Voltage sag prediction; voltage sag monitoring; Poisson process; exponential distribution; gamma distribution; PREDICTION;
D O I
10.1109/TPWRD.2018.2878997
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Computational methods for predicting voltage sags consider their occurrence as a Poisson process, although without confirmation from monitoring data, until now. In this paper, the stochastic nature of voltage sags is analyzed and discussed using monitoring data from 60 sites of the Portuguese Transmission Network, covering the years 2011-2015 (a total of 17 157 recorded voltage sags). A mathematical model to describe the voltage sag occurrence as a stochastic process is presented. The assumption of constant failure rates of the network elements implies that the occurrence of voltage sags is a Poisson process. However, that assumption is not valid if voltage sag clusters are included, as these imply considering time-dependent failure rates. Then, the time between voltage sags is described by an exponential distribution, if clusters are not included, and may be described by the gamma distribution, if including clusters. The boundaries of the adequacy of exponential and gamma distributions are assessed, based on monitoring data. The time of occurrence of monitored voltage sags are analyzed and results confirm that the Poisson process describes the occurrence of voltage sags when voltage sag clusters are disregarded. The gamma distribution fitting is also confirmed when clusters are included in the analysis.
引用
收藏
页码:496 / 504
页数:9
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