Non-destructive evaluation of material structure by second harmonic generation

被引：0
|
作者：
Blanc, D [1 ]
Cachard, A [1 ]
Pommier, JC [1 ]
机构：
[1] UNIV ST ETIENNE, UMR CNRS 5516, LAB TRAITEMENT SIGNAL & INSTRUMENTAT, F-42023 ST ETIENNE 2, FRANCE
来源：
OPTICAL INSPECTION AND MICROMEASUREMENTS | 1996年 / 2782卷
关键词：
thin film characterization; optical diagnostic; second harmonic generation;
D O I：
10.1117/12.250809
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：763 / 773
页数：11
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