Polarization-dependent phenomena in the reflectivity spectra of semiconductor quantum microcavities

被引：47
|
作者：
Baxter, D
Skolnick, MS
Armitage, A
Astratov, VN
Whittaker, DM
Fisher, TA
Roberts, JS
Mowbray, DJ
Kaliteevski, MA
机构：
[1] AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA
[2] TOSHIBA CAMBRIDGE RES CTR,CAMBRIDGE CB4 4WE,ENGLAND
[3] UNIV SHEFFIELD,DEPT ELECT & ELECT ENGN,SHEFFIELD S1 3JD,S YORKSHIRE,ENGLAND
来源：
PHYSICAL REVIEW B | 1997年 / 56卷 / 16期
关键词：
D O I：
10.1103/PhysRevB.56.R10032
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Angular-dependent reflectivity techniques are employed to probe the exciton-polariton states of a semiconductor quantum microcavity. The spectra exhibit marked polarization dependence, with the energies, line widths, and intensities all differing between transverse-electric and transverse-magnetic polarizations, consistent with the predictions of transfer-matrix simulations. In addition, anomalous narrowing of the spectra on resonance, broadening of the cavity mode by interaction with exciton continuum states and interaction of the cavity mode with quantum-well excited-state transitions are reported. [S0163-1829(97)52040-6].
引用
收藏
页码：10032 / 10035
页数：4
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