Circuit-level characterization and loss modeling of SiC-based power electronic converters

被引:0
|
作者
Ravi, Lakshmi [1 ]
Severson, Eric L. [1 ]
Tewari, Saurabh [1 ]
Mohan, Ned [1 ]
机构
[1] Univ Minnesota, Minneapolis, MN 55455 USA
关键词
SiC device; gate drive; practical characterization; loss estimation;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents the design, characterization, and modeling of a power electronic converter based around Silicon Carbide (SiC) MOSFETs. A practical characterization procedure is proposed which takes a circuit-level approach, as opposed to a device-level approach, using only the power electronic circuit and no additional test circuitry. The converter circuit is general enough that it can represent a dc chopper circuit or an output phase of an inverter. The design of the converter, including the SiC-specific gate drive circuit, is described. The hardware setup was operated at frequencies up to 200 kHz and efficiencies up to approximately 99% were recorded. A model for predicting converter and driver losses at different load currents, dc bus voltages, and operating temperatures was constructed; the predictions from the model were in good agreement with the measurements.
引用
收藏
页码:1291 / 1297
页数:7
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