Innovative methodology to extract dynamic compact thermal models: Application to power devices

被引:2
|
作者
Azoui, Toufik [1 ,2 ]
Tounsi, Patrick [1 ,2 ]
Dorkel, Jean-Marie [1 ,2 ]
机构
[1] LAAS CNRS, F-31077 Toulouse 4, France
[2] Univ Toulouse, UPS, INSA, INP,ISAE,LAAS, F-31077 Toulouse, France
关键词
Dynamic compact thermal model (DCTM); Boundary condition independent (BCI); Optimization; VHDL-AMS; Power devices; ULTRA-LOW; PACKAGES; MOSFET;
D O I
10.1016/j.mejo.2011.09.005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a new and innovative methodology for power components manufacturers to generate accurate boundary condition independent dynamic Compact Thermal Models ("BCI" DCTMs). The originality of this methodology is summarized by taking into account the thermal behavior of electronic components containing several cooling surfaces, and representing the non-linear properties of materials, while keeping a simple and recurring structure of generated models. Moreover, the proposed method makes it possible to obtain DCTMs with a limited number of measurements or 3D thermal simulations. The methodology to construct the DCTM is based on the construction of an equivalent thermal RC network The precision of the RC thermal network is improved using variable resistances and capacitances related to the heat fluxes so that the compact model can adapt automatically with boundary conditions. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:642 / 648
页数:7
相关论文
共 50 条
  • [1] A new methodology for extraction of dynamic compact thermal models
    Habra, W.
    Tounsi, P.
    Madrid, F.
    Dupuy, Ph.
    Barbot, C.
    Dorkel, J-M.
    13TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATION OF ICS AND SYSTEMS, PROCEEDINGS, 2007, : 141 - +
  • [2] A methodology to extract dynamic compact thermal models under time-varying boundary conditions:: application to a thermopile based IR sensor
    Salleras, M
    Palacín, J
    Moreno, M
    Santander, J
    Fonseca, L
    Samitier, J
    Marco, S
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2005, 12 (1-2): : 21 - 29
  • [3] A methodology to extract dynamic compact thermal models under time-varying boundary conditions: application to a thermopile based IR sensor
    M. Salleras
    J. Palacín
    M. Moreno
    J. Santander
    L. Fonseca
    J. Samitier
    S. Marco
    Microsystem Technologies, 2005, 12 : 21 - 29
  • [4] Dynamic electro-thermal physically based compact models of the power devices for device and circuit simulations
    Igic, PM
    Mawby, PA
    Towers, MS
    Batcup, S
    SEVENTEENTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, PROCEEDINGS 2001, 2001, : 35 - 42
  • [5] Dynamic compact thermal models with multiple power sources:: Application to an ultrathin chip stacking technology
    Palacín, J
    Salleras, M
    Samitier, J
    Marco, S
    IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2005, 28 (04): : 694 - 703
  • [6] A generic methodology for deriving compact dynamic thermal models, applied to the PSGA package
    Christiaens, F
    Vandevelde, B
    Beyne, E
    Mertens, R
    Berghmans, J
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1998, 21 (04): : 565 - 576
  • [7] Compact Thermal Models of Semiconductor Devices - a Review
    Gorecki, Krzysztof
    Zarebski, Janusz
    Gorecki, Pawel
    Ptak, Przemyslaw
    INTERNATIONAL JOURNAL OF ELECTRONICS AND TELECOMMUNICATIONS, 2019, 65 (02) : 151 - 158
  • [8] Compact models for silicon carbide power devices
    McNutt, T
    Hefner, A
    Mantooth, A
    Berning, D
    Singh, R
    SOLID-STATE ELECTRONICS, 2004, 48 (10-11) : 1757 - 1762
  • [9] Calibration of Detailed Thermal Models by Parametric Dynamic Compact Thermal Models
    Codecasa, Lorenzo
    d'Alessandro, Vincenzo
    Magnani, Alessandro
    Rinaldi, Niccolo
    2016 22ND INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC), 2016, : 69 - 75
  • [10] A methodology for the generation of dynamic compact models of packages and heat sinks from thermal transient measurements
    Rencz, M
    Farkas, G
    Poppe, A
    Székely, V
    Courtois, B
    IEEE/CPMT/SEMI(R) 28TH INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM, 2003, : 117 - 123