Measuring phonon dephasing with ultrafast pulses using Raman spectral interference

被引:32
|
作者
Waldermann, F. C. [1 ]
Sussman, Benjamin J. [1 ,3 ]
Nunn, J. [1 ]
Lorenz, V. O. [1 ]
Lee, K. C. [1 ]
Surmacz, K. [1 ]
Lee, K. H. [1 ]
Jaksch, D. [1 ]
Walmsley, I. A. [1 ]
Spizziri, P. [2 ]
Olivero, P. [2 ]
Prawer, S. [2 ]
机构
[1] Univ Oxford, Clarendon Lab, Oxford OX1 3PU, England
[2] Univ Melbourne, Sch Phys, Ctr Quantum Comp Technol, Parkville, Vic 3010, Australia
[3] Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1103/PhysRevB.78.155201
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A technique to measure the decoherence time of optical phonons in a solid is presented. Phonons are excited with a pair of time-delayed 80 fs near infrared pulses via spontaneous transient Raman scattering. The spectral fringe visibility of the resulting Raman pulse pair, as a function of time delay, is used to measure the phonon dephasing time. The method avoids the need to use either narrow band or few femtosecond pulses and is useful for low phonon excitations. The dephasing time of phonons created in bulk diamond is measured to be tau=6.8 ps (Delta nu=1.56 cm(-1)).
引用
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页数:6
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