Classification via local multi-resolution projections

被引:3
|
作者
Monnier, Jean-Baptiste [1 ]
机构
[1] Univ Paris 07, LPMA, Off 5B01, F-75013 Paris, France
来源
关键词
Nonparametric regression; random design; multi-resolution analysis; supervised binary classification; margin assumption; RANDOM DESIGN; WAVELET REGRESSION; DENSITY-ESTIMATION; OPTIMAL RATES; CONVERGENCE; SHRINKAGE; FOURIER;
D O I
10.1214/12-EJS677
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
We focus on the supervised binary classification problem, which consists in guessing the label Y associated to a co-variate X is an element of R-d, given a set of n independent and identically distributed co-variates and associated labels (X-i, Y-i). We assume that the law of the random vector (X, Y) is unknown and the marginal law of X admits a density supported on a set A. In the particular case of plug-in classifiers, solving the classification problem boils down to the estimation of the regression function eta(X) = E[Y vertical bar X]. Assuming first A to be known, we show how it is possible to construct an estimator of eta by localized projections onto a multi-resolution analysis (MRA). In a second step, we show how this estimation procedure generalizes to the case where A is unknown. Interestingly, this novel estimation procedure presents similar theoretical performances as the celebrated local-polynomial estimator (LPE). In addition, it benefits from the lattice structure of the underlying MRA and thus outperforms the LPE from a computational standpoint, which turns out to be a crucial feature in many practical applications. Finally, we prove that the associated plug-in classifier can reach super-fast rates under a margin assumption.
引用
收藏
页码:382 / 420
页数:39
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