Estimates of medical device-associated adverse events.

被引：0
|
作者：
Hefflin, B. [1 ]
Gross, T. [1 ]
Schroeder, T. [1 ]
机构：
[1] US FDA, Rockville, MD 20850 USA
来源：
AMERICAN JOURNAL OF EPIDEMIOLOGY | 2006年 / 163卷 / 11期
关键词：
D O I：
10.1093/aje/163.suppl_11.S171-c
中图分类号：
R1 [预防医学、卫生学];
学科分类号：
1004 ; 120402 ;
摘要：
引用
收藏
页码：S171 / S171
页数：1
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