High-Performance Programmable Metallization Cell Memory With the Pyramid-Structured Electrode

被引:25
|
作者
Huang, Yu-Chih [1 ,2 ]
Tsai, Wan-Lin [1 ,2 ]
Chou, Chia-Hsin [1 ,2 ]
Wan, Chung-Yun [1 ,2 ]
Hsiao, Ching [1 ,2 ]
Cheng, Huang-Chung [1 ,2 ]
机构
[1] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 30010, Taiwan
[2] Natl Chiao Tung Univ, Inst Elect, Hsinchu 30010, Taiwan
关键词
Potassium hydroxide (KOH) surface texturing; programmable metallization cell (PMC); pyramid structure; resistive random-access memory (RRAM or ReRAM);
D O I
10.1109/LED.2013.2275851
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The pyramid structure fabricated with the potassium hydroxide (KOH) anisotropically etched (100) silicon substrate has been deposited with a copper film as the bottom electrode of the programmable metallization cell (PMC) memory to significantly improve the resistive switching characteristic. As compared with the conventional flat copper electrode, this pyramid-structured electrode exhibited the set/reset voltage as low as 1/0.6 V and superior endurance of 2400 cycles at the set/reset voltages of -5/+3 V for the voltages pulsewidth of 1 mu s. The high performance of this PMC could be attributed to high local electrical fields at the tips of the pyramid structure, resulting in the formation of the narrower conductive filaments that facilitate the lower operation voltage and better endurance.
引用
收藏
页码:1244 / 1246
页数:3
相关论文
共 50 条
  • [1] High-performance resistive switching characteristics of programmable metallization cell with oxidized Cu-Ti electrodes
    Huang, Yu-Chih
    Chou, Chia-Hsin
    Liao, Chan-Yu
    Tsai, Wan-Lin
    Cheng, Huang-Chung
    [J]. APPLIED PHYSICS LETTERS, 2013, 103 (14)
  • [2] Reliable Multistate Data Storage with Low Power Consumption by Selective Oxidation of Pyramid-Structured Resistive Memory
    Kirn, Youngjin
    Choi, Hanhyeong
    Park, Hyun S.
    Kang, Moon Sung
    Shin, Keun-Young
    Lee, Sang-Soo
    Park, Jong Hyuk
    [J]. ACS APPLIED MATERIALS & INTERFACES, 2017, 9 (44) : 38643 - 38650
  • [3] Logic-in-Memory With a Nonvolatile Programmable Metallization Cell
    Junsangsri, Pilin
    Han, Jie
    Lombardi, Fabrizio
    [J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2016, 24 (02) : 521 - 529
  • [4] Radiation tolerance of programmable metallization cell memory devices
    Kozicki, Michael N.
    Barnaby, Hugh
    Mitkova, Maria
    Velo, Yago Gonzalez
    Dandamudi, Pradeep
    Ailavajhala, Mahesh
    Holbert, Keith
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2014, 247
  • [5] Low voltage cycling of programmable metallization cell memory devices
    Kamalanathan, D.
    Akhavan, A.
    Kozicki, M. N.
    [J]. NANOTECHNOLOGY, 2011, 22 (25)
  • [6] Study of Multilevel Programming in Programmable Metallization Cell (PMC) Memory
    Russo, Ugo
    Kamalanathan, Deepak
    Ielmini, Daniele
    Lacaita, Andrea L.
    Kozicki, Michael N.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2009, 56 (05) : 1040 - 1047
  • [7] A HIGH-PERFORMANCE SI MEMORY CELL
    LEENAERTS, DMW
    LEEUWENBURGH, AJ
    PERSOON, GG
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1994, 29 (11) : 1404 - 1407
  • [8] Inherent diode isolation in programmable metallization cell resistive memory elements
    Sarath C. Puthentheradam
    Dieter K. Schroder
    Michael N. Kozicki
    [J]. Applied Physics A, 2011, 102 : 817 - 826
  • [9] Inherent diode isolation in programmable metallization cell resistive memory elements
    Puthentheradam, Sarath C.
    Schroder, Dieter K.
    Kozicki, Michael N.
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2011, 102 (04): : 817 - 826
  • [10] Metallization by plating for high-performance multichip modules
    IBM Microelectronics Division, East Fishkill Facility, Route 52, Hopewell Junction, NY 12533, United States
    不详
    不详
    不详
    不详
    不详
    不详
    不详
    不详
    不详
    不详
    [J]. IBM J Res Dev, 5 (587-596):