Analytical Study of Noise Spectral Density in Q-controlled Atomic Force Microscopy

被引:1
|
作者
Lee, Manhee [1 ]
An, Sangmin [2 ,3 ]
Jhe, Wonho [2 ,3 ]
机构
[1] Chungbuk Natl Univ, Dept Phys, Cheongju 28644, South Korea
[2] Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea
[3] Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea
基金
新加坡国家研究基金会;
关键词
Atomic force microscopy; Q-control; Noise spectral density; Quality factor; IONIC LIQUIDS;
D O I
10.3938/jkps.72.384
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Q-controlled atomic force microscopy utilizes an oscillating probe with an adjustable quality factor, which is done by adding a variable damping interaction to the probe. While the Q-control can enhance the probe sensitivity by increasing the Q-factor, the applied interaction increases the noise of the probe motion as well. Thus, the signal-to-noise ratio (SNR) associated with the probe sensitivity varies accordingly. Here, we analytically derive the noise spectral density of the tip motion, and theoretically investigate the SNR in Q-controlled atomic force microscopy. We show that both the overall tip-motion signal and the noise monotonically increase with the effective Q-factor under control, whereas the SNR exhibits a global minimum near the original Q value and asymptotically scales as the square root of the effective Q-factor. Therefore, in general, the Qcontrol technique can be used to alter the quality factor, the magnitudes of signal and noise, and the probe sensitivity in amplitude-modulation atomic force microscopy.
引用
收藏
页码:384 / 389
页数:6
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