Photoemission, X-ray absorption and X-ray emission study of boron carbides

被引：26
|
作者：
Jiménez, I [1 ]
Terminello, LJ
Himpsel, FJ
Grush, M
Callcott, TA
机构：
[1] CSIC, Inst Ciencia Mat, Madrid 28049, Spain
[2] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
[3] Univ Wisconsin, Dept Phys, Madison, WI 53706 USA
[4] Univ Tennessee, Dept Phys, Knoxville, TN 37996 USA
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1999年 / 101卷
关键词：
boron carbide; boron; photoemission; X-ray absorption; fluorescence;
D O I：
10.1016/S0368-2048(98)00342-9
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Photoemission (PES), X-ray absorption (XAS) and soft X-ray fluorescence (SXF) measurements have been performed on a variety of boron carbide samples to explore the possibilities of synchrotron-based spectroscopies in determining the atomic and electronic structure of this complex material. B4C bulk samples and powders, boron-rich BxC thin films, and boron powders (amorphous and crystalline) have been studied. The results are discussed in terms of the current structural models. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：611 / 615
页数：5
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