Continuous Software Reliability Models - How Good Are They?

被引:0
|
作者
Jin, Lin-Zhu [1 ]
Dohi, Tadashi [1 ]
Osaki, Shunji [2 ]
机构
[1] Hiroshima Univ, Grad Sch Engn, Dept Informat Engn, 1-4-1 Kagamiyama, Higashihiroshima 724, Japan
[2] Nanzan Univ, Fac Informat Sci & Engn, Seto, Japan
关键词
reliability growth modeling; continuous-state models; diffusion processes; gamma wear processes; software-fault data analysis;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
For large scale software systems with a huge number of codes, it may be often useful to regard the fault-counting processes observed in testing phase as continuous-state stochastic processes. In this paper we introduce two types of continuous-state software reliability models; diffusion processes with time-dependent drift and non-stationary gamma wear processes, and compare them with the usual non-homogeneous Poisson processes. We expect that our models can provide the better goodness-of-fit performance than the existing software reliability models in many cases and provide convenient assessment tools to estimate the software reliability.
引用
收藏
页码:405 / 410
页数:6
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