Photoconductive sampling with a scanning tunneling microscope

被引：0
|
作者：
Gielkens, O [1 ]
Kaufmann, LMF [1 ]
Smalbrugge, E [1 ]
Melloch, MR [1 ]
Groeneveld, RHM [1 ]
Rasing, T [1 ]
van Kempen, H [1 ]
机构：
[1] Catholic Univ Nijmegen, Mat Res Inst, NL-6525 ED Nijmegen, Netherlands
来源：
ULTRAFAST PHENOMENA XI | 1998年 / 63卷
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
An experimental equivalent of the lumped circuit model of a photoconductively gated scanning tunneling microscope (PG-STM) is studied. This model can be used as long as the distance between the tunnel-junction and the pc-switch is small. For suitable parameters it implies a response-time below the carrier lifetime in the pc-switch.
引用
收藏
页码：162 / 164
页数：3
相关论文
共 50 条
  • [1] Measurements of photoconductive switches with an ultrafast scanning tunneling microscope
    Lan, T
    Ni, GQ
    [J]. NANO-OPTICS AND NANO-STRUCTURES, 2002, 4923 : 114 - 118
  • [2] A SCANNING TUNNELING MICROSCOPE WITH A WIDE SAMPLING RANGE
    HIPPS, KW
    FRIED, G
    FRIED, D
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (07): : 1869 - 1873
  • [3] THE SCANNING TUNNELING MICROSCOPE
    SALVAN, F
    [J]. RECHERCHE, 1986, 17 (181): : 1202 - &
  • [4] SCANNING TUNNELING MICROSCOPE
    PARK, SI
    QUATE, CF
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (11): : 2010 - 2017
  • [5] SCANNING TUNNELING MICROSCOPE
    UOSAKI, K
    [J]. DENKI KAGAKU, 1991, 59 (04): : 302 - 307
  • [6] THE SCANNING TUNNELING MICROSCOPE
    BINNIG, G
    ROHRER, H
    [J]. SCIENTIFIC AMERICAN, 1985, 253 (02) : 50 - &
  • [7] SCANNING TUNNELING MICROSCOPE COMBINED WITH SCANNING ELECTRON-MICROSCOPE
    ICHINOKAWA, T
    MIYAZAKI, Y
    KOGA, Y
    [J]. ULTRAMICROSCOPY, 1987, 23 (01) : 115 - 118
  • [8] THE COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
    BARO, AM
    VAZQUEZ, L
    BARTOLOME, A
    GARCIA, R
    [J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 283 - 283
  • [9] COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
    VAZQUEZ, L
    BARTOLOME, A
    GARCIA, R
    BUENDIA, A
    BARO, AM
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (08): : 1286 - 1289
  • [10] THE COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
    BARO, AM
    VAZQUEZ, L
    BARTOLOME, A
    GARCIA, R
    [J]. EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 283 - 283
12345